DocumentCode :
430133
Title :
Variance expressions for software reliability growth models
Author :
Gokhale, Swapna S.
Author_Institution :
Dept. of Comput. Sci & Eng., Connecticut Univ., Storrs, CT, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
628
Lastpage :
633
Keywords :
failure analysis; parameter estimation; software fault tolerance; stochastic processes; Goel-Okumoto model; generic expression; generic function; non homogeneous Poisson process; parameter estimation; software reliability growth model; variance expression; Application software; Convergence; Genetic expression; Maximum likelihood estimation; Parameter estimation; Resource management; Software metrics; Software reliability; Software testing; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408434
Filename :
1408434
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=430133
بازگشت