DocumentCode :
430245
Title :
Functions for quality transition fault tests
Author :
Michael, Maria K. ; Neophytou, Stelios ; Tragoudas, Spyros
Author_Institution :
Dept. of Eelctr. & Comput. Eng., Univ. of Cyprus, Nicosia, Albania
fYear :
2005
fDate :
21-23 March 2005
Firstpage :
327
Lastpage :
332
Abstract :
The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS´85 and ISCAS´89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.
Keywords :
automatic test pattern generation; benchmark testing; delays; digital integrated circuits; integrated circuit testing; quality control; ATPG methods; benchmarks; circuit traversal; compaction methods; delay testing; digital circuits; quality test generation; test function generation; transition fault tests; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Compaction; Data structures; Digital circuits; Electrical fault detection; Fault detection; Propagation delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
Type :
conf
DOI :
10.1109/ISQED.2005.60
Filename :
1410604
Link To Document :
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