• DocumentCode
    430245
  • Title

    Functions for quality transition fault tests

  • Author

    Michael, Maria K. ; Neophytou, Stelios ; Tragoudas, Spyros

  • Author_Institution
    Dept. of Eelctr. & Comput. Eng., Univ. of Cyprus, Nicosia, Albania
  • fYear
    2005
  • fDate
    21-23 March 2005
  • Firstpage
    327
  • Lastpage
    332
  • Abstract
    The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS´85 and ISCAS´89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.
  • Keywords
    automatic test pattern generation; benchmark testing; delays; digital integrated circuits; integrated circuit testing; quality control; ATPG methods; benchmarks; circuit traversal; compaction methods; delay testing; digital circuits; quality test generation; test function generation; transition fault tests; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Compaction; Data structures; Digital circuits; Electrical fault detection; Fault detection; Propagation delay;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
  • Print_ISBN
    0-7695-2301-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2005.60
  • Filename
    1410604