DocumentCode
430245
Title
Functions for quality transition fault tests
Author
Michael, Maria K. ; Neophytou, Stelios ; Tragoudas, Spyros
Author_Institution
Dept. of Eelctr. & Comput. Eng., Univ. of Cyprus, Nicosia, Albania
fYear
2005
fDate
21-23 March 2005
Firstpage
327
Lastpage
332
Abstract
The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS´85 and ISCAS´89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.
Keywords
automatic test pattern generation; benchmark testing; delays; digital integrated circuits; integrated circuit testing; quality control; ATPG methods; benchmarks; circuit traversal; compaction methods; delay testing; digital circuits; quality test generation; test function generation; transition fault tests; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Compaction; Data structures; Digital circuits; Electrical fault detection; Fault detection; Propagation delay;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN
0-7695-2301-3
Type
conf
DOI
10.1109/ISQED.2005.60
Filename
1410604
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