Title :
An investigation of losses in microstrip lines
Author :
Zakaria, Nor Ayu Zalina ; Free, Charles
Author_Institution :
Fac. of Electr. Eng., Univ. of Technol. MARA, Selangor, Malaysia
Abstract :
This paper addresses the characterization of the sources of microstrip line losses by varying the surface roughness, loss tangent, dielectric constant and the height of the substrates. This is done by using simulations of microstrip line test circuits. Then, the test circuits are modeled using different type of substrates. Measurements are carried out by using a vector network analyzer to make comparisons between measurement results and simulation results. All the results substantially verify the theory.
Keywords :
dielectric losses; microstrip lines; permittivity; surface roughness; dielectric constant; loss tangent; microstrip line losses; substrate height; surface roughness; vector network analyzer; Analytical models; Circuit simulation; Circuit testing; Dielectric constant; Dielectric losses; Dielectric measurements; Dielectric substrates; Microstrip; Rough surfaces; Surface roughness;
Conference_Titel :
RF and Microwave Conference, 2004. RFM 2004. Proceedings
Print_ISBN :
0-7803-8671-X
DOI :
10.1109/RFM.2004.1411084
