DocumentCode :
430873
Title :
Inspection of defect on LCD panel using polynomial approximation
Author :
Baek, Seung-Il ; Kim, Woo-Seob ; Koo, Tak-Mo ; Choi, Il ; Park, Kil-Houm
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Taegu, South Korea
Volume :
A
fYear :
2004
fDate :
21-24 Nov. 2004
Firstpage :
235
Abstract :
Nowadays, the CRT display devices are rapidly substituted for LCD display devices. In LCD panel production, the inspection process relies on human vision. So, the results of inspection is likely to be subjective. Therefore, we need the automated inspection system for LCD devices by obtaining objective decision level. In this paper, we propose an efficient automated inspection algorithm using polynomial approximation and optimal thresholding technique. The experimental result shows us that our proposed system can have enough performance for substitution of human inspectors.
Keywords :
computer vision; inspection; liquid crystal displays; polynomial approximation; CRT display device; LCD panel; automated inspection system; computer vision; defect inspection; image flattening method; optimal thresholding technique; polynomial approximation; Computer displays; Costs; Equations; Humans; Inspection; Liquid crystal displays; Mean square error methods; Polynomials; Production; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2004. 2004 IEEE Region 10 Conference
Print_ISBN :
0-7803-8560-8
Type :
conf
DOI :
10.1109/TENCON.2004.1414400
Filename :
1414400
Link To Document :
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