Title :
A systematic approach for the reliability of RFID systems
Author :
Inoue, Sozo ; Hagiwara, Daisuke ; Yasuura, Hiroto
Author_Institution :
Syst. LSI Res. Center, Kyushu Univ., Fukuoka, Japan
Abstract :
In this paper, we address reliability issues in the \´digitally named world\´, which is the environment in which RFID (radio frequency identification) tags are attached to any objects in the real world. We propose a systematic approach to maintain the reliability and analyze the effect of our approach, and show that the possibility of identification failure are reduced to O(p
2) (0
\n\n\t\t
Keywords :
computational complexity; fault diagnosis; radiofrequency identification; reliability; ubiquitous computing; RFID systems reliability; identification failure; radio frequency identification tags; Books; Libraries; RFID tags; Radiofrequency identification;
Conference_Titel :
TENCON 2004. 2004 IEEE Region 10 Conference
Print_ISBN :
0-7803-8560-8
DOI :
10.1109/TENCON.2004.1414562
