Title :
Image Denoising for Signal-Dependent Noise
Author :
Hirakawa, Keigo ; Parks, Thomas W.
Author_Institution :
New England Conservatory of Music, Boston, MA, USA
fDate :
March 18-23, 2005
Keywords :
image denoising; least squares approximations; additive noise; edge artifact reduction; edge sharpening; ideal image patch modeling; image denoising; image quality; measured data uncertainties; mixed noise; multiplicative noise; signal-dependent noise; total least square method; Additive noise; CMOS image sensors; CMOS technology; Digital images; Gaussian noise; Image denoising; Least squares methods; Noise reduction; Semiconductor device modeling; Wavelet coefficients;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 2005. Proceedings. (ICASSP '05). IEEE International Conference on
Print_ISBN :
0-7803-8874-7
DOI :
10.1109/ICASSP.2005.1415333