Analysis of the SAW propagation in langasite crystal by X-ray topography

Author

Roshchupkin, D.V. ; Roshchupkina, H.D. ; Irzhak, D.V. ; Buzanov, O.A.

Author_Institution

Inst. of Microelectron. Technol., RAS, Chernogolovka, Russia

Volume

2

fYear

2004

fDate

23-27 Aug. 2004

Firstpage

1227

Abstract

X-ray Bragg diffraction on the X, Y, and (011) cuts of a langasite crystal (La₃Ga₅SiO₁₄, LGS) modulated by a Rayleigh surface acoustic wave (SAW) has been studied using a high-resolution X-ray topography method. This X-ray topography technique was used for direct imaging of the standing SAW in LGS, to measure the SAW amplitudes and power flow angles, to visualize the diffraction patterns in acoustic beams, and to study the process of the SAW interaction with crystal structure defects.

Keywords

Rayleigh waves; X-ray topography; acoustic wave diffraction; acoustic wave propagation; crystal defects; surface acoustic wave devices; Bragg diffraction; LGS; La₃Ga₅SiO₁₄; Rayleigh surface acoustic wave; SAW amplitudes; SAW propagation; acoustic beams; crystal structure defects; diffraction pattern visualization; direct imaging; high-resolution X-ray topography; langasite crystal; power flow angles; standing SAW; Acoustic diffraction; Acoustic imaging; Acoustic propagation; Acoustic waves; High-resolution imaging; Optical imaging; Surface acoustic waves; Surface topography; X-ray diffraction; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 2004 IEEE

ISSN

1051-0117

Print_ISBN

0-7803-8412-1

Type

conf

DOI

10.1109/ULTSYM.2004.1418009

Filename

1418009