DocumentCode :
432366
Title :
An investigation into the effects of electrode film thickness on RBA in high frequency fundamental mode crystals
Author :
Morris, R.
Author_Institution :
Connor-Winfield, Aurora, IL, USA
fYear :
2004
fDate :
23-27 Aug. 2004
Firstpage :
369
Lastpage :
370
Abstract :
The impact of electrode film thickness on the Tc characteristics of high frequency fundamental mode AT-strip crystals has been characterized. In particular, we have studied how RBA (relative Bechmann angle) and inflection temperature vary as the thickness of the gold plated electrode is increased from 0.75F1ÿ2 to 1.2F1ÿ2. Our characterization encompassed the entire frequency range between 77.76 MHz and 250 MHz. We have also investigated how variations in plating thickness impact Tc behavior in HFF mode crystals when other commonly used metals are utilized. The paper presents our results, and compares and contrasts them with data collected by other authors at lower frequencies. Furthermore we discuss the implications of these data on the industry´s ability to make even higher frequency fundamental mode crystals.
Keywords :
electrodes; piezoelectric devices; piezoelectric materials; 77.76 to 250 MHz; AT-cut resonators; AT-strip crystals; electrode film thickness; gold plated electrode; high frequency fundamental mode crystals; inflection temperature; plating thickness; relative Bechmann angle; Adhesives; Chromium; Crystalline materials; Crystals; Electrodes; Frequency; Gold; Nickel; Temperature distribution; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-8414-8
Type :
conf
DOI :
10.1109/FREQ.2004.1418482
Filename :
1418482
Link To Document :
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