• DocumentCode
    432366
  • Title

    An investigation into the effects of electrode film thickness on RBA in high frequency fundamental mode crystals

  • Author

    Morris, R.

  • Author_Institution
    Connor-Winfield, Aurora, IL, USA
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    369
  • Lastpage
    370
  • Abstract
    The impact of electrode film thickness on the Tc characteristics of high frequency fundamental mode AT-strip crystals has been characterized. In particular, we have studied how RBA (relative Bechmann angle) and inflection temperature vary as the thickness of the gold plated electrode is increased from 0.75F1ÿ2 to 1.2F1ÿ2. Our characterization encompassed the entire frequency range between 77.76 MHz and 250 MHz. We have also investigated how variations in plating thickness impact Tc behavior in HFF mode crystals when other commonly used metals are utilized. The paper presents our results, and compares and contrasts them with data collected by other authors at lower frequencies. Furthermore we discuss the implications of these data on the industry´s ability to make even higher frequency fundamental mode crystals.
  • Keywords
    electrodes; piezoelectric devices; piezoelectric materials; 77.76 to 250 MHz; AT-cut resonators; AT-strip crystals; electrode film thickness; gold plated electrode; high frequency fundamental mode crystals; inflection temperature; plating thickness; relative Bechmann angle; Adhesives; Chromium; Crystalline materials; Crystals; Electrodes; Frequency; Gold; Nickel; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-8414-8
  • Type

    conf

  • DOI
    10.1109/FREQ.2004.1418482
  • Filename
    1418482