DocumentCode
432366
Title
An investigation into the effects of electrode film thickness on RBA in high frequency fundamental mode crystals
Author
Morris, R.
Author_Institution
Connor-Winfield, Aurora, IL, USA
fYear
2004
fDate
23-27 Aug. 2004
Firstpage
369
Lastpage
370
Abstract
The impact of electrode film thickness on the Tc characteristics of high frequency fundamental mode AT-strip crystals has been characterized. In particular, we have studied how RBA (relative Bechmann angle) and inflection temperature vary as the thickness of the gold plated electrode is increased from 0.75F1ÿ2 to 1.2F1ÿ2. Our characterization encompassed the entire frequency range between 77.76 MHz and 250 MHz. We have also investigated how variations in plating thickness impact Tc behavior in HFF mode crystals when other commonly used metals are utilized. The paper presents our results, and compares and contrasts them with data collected by other authors at lower frequencies. Furthermore we discuss the implications of these data on the industry´s ability to make even higher frequency fundamental mode crystals.
Keywords
electrodes; piezoelectric devices; piezoelectric materials; 77.76 to 250 MHz; AT-cut resonators; AT-strip crystals; electrode film thickness; gold plated electrode; high frequency fundamental mode crystals; inflection temperature; plating thickness; relative Bechmann angle; Adhesives; Chromium; Crystalline materials; Crystals; Electrodes; Frequency; Gold; Nickel; Temperature distribution; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
ISSN
1075-6787
Print_ISBN
0-7803-8414-8
Type
conf
DOI
10.1109/FREQ.2004.1418482
Filename
1418482
Link To Document