• DocumentCode
    432379
  • Title

    Dielectric strength of series - connected vacuum GAPS

  • Author

    Sidorov, V.A. ; Alferov, D.F. ; Alferova, E.D.

  • Author_Institution
    Russian Electrotechnical Institute (VEI), Krasnokazarmennaya 12, 111250 Moscow, Russia
  • Volume
    1
  • fYear
    2004
  • fDate
    Sept. 27 2004-Oct. 1 2004
  • Firstpage
    68
  • Lastpage
    71
  • Abstract
    The paper presents techniques and formulas for calculation of the electric strength of a facility with a random number of series connected vacuum gaps.
  • Keywords
    Breakdown voltage; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Interrupters; Probability; Semiconductor devices; Sulfur hexafluoride; Switches; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. XXIst International Symposium on
  • Conference_Location
    Yalta, Crimea
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-8461-X
  • Type

    conf

  • DOI
    10.1109/DEIV.2004.1418603
  • Filename
    1418603
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=432379