Title :
Dielectric strength of series - connected vacuum GAPS
Author :
Sidorov, V.A. ; Alferov, D.F. ; Alferova, E.D.
Author_Institution :
Russian Electrotechnical Institute (VEI), Krasnokazarmennaya 12, 111250 Moscow, Russia
fDate :
Sept. 27 2004-Oct. 1 2004
Abstract :
The paper presents techniques and formulas for calculation of the electric strength of a facility with a random number of series connected vacuum gaps.
Keywords :
Breakdown voltage; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Interrupters; Probability; Semiconductor devices; Sulfur hexafluoride; Switches; Vacuum technology;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. XXIst International Symposium on
Conference_Location :
Yalta, Crimea
Print_ISBN :
0-7803-8461-X
DOI :
10.1109/DEIV.2004.1418603
