DocumentCode
432620
Title
An efficient method for the measurement of the scattering-parameters of multi-ports with a two-port network-analyzer
Author
Rolfes, I. ; Schiek, B.
Volume
2
fYear
2004
fDate
12-14 Oct. 2004
Firstpage
797
Lastpage
800
Abstract
The multi-port method for the measurement of the scattering parameters of N-port devices with M-port vector network analyzers (VNA) with M\n\n\t\t
Keywords
Calibration; Circuit topology; Error correction; Impedance; Performance analysis; Performance evaluation; Scattering parameters; Switches; Testing; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2004. 34th European
Conference_Location
Amsterdam, The Netherlands
Print_ISBN
1-58053-992-0
Type
conf
Filename
1418942
Link To Document