Method for separating dielectric surface loss terms on CVD-diamond disks

Author

Danilov, I. ; Heidinger, R. ; Meier, A.

Author_Institution

Inst. fur Materialforschung, Forschungszentrum Karlsruhe, Germany

fYear

2004

fDate

27 Sept.-1 Oct. 2004

Firstpage

213

Lastpage

214

Abstract

The separation and quantification of dielectric surface losses are achieved by measuring chemical vapour deposition (CVD) diamond disks both in hemispherical and symmetrical open resonators for arbitrary thickness of the disks. The measurement data are modelled by expressions based on impedance transformation (IT) theory to describe the contribution of each surface to the total loss.

Keywords

CVD coatings; diamond; dielectric loss measurement; dielectric resonators; millimetre wave measurement; C; CVD diamond disks; chemical vapour deposition; dielectric surface loss separation; hemispherical open resonators; impedance transformation theory; millimetre wave measurement; symmetrical open resonators; Chemical vapor deposition; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Loss measurement; Permittivity measurement; Propagation losses; Q factor; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on

Print_ISBN

0-7803-8490-3

Type

conf

DOI

10.1109/ICIMW.2004.1422030

Filename

1422030