• DocumentCode
    433304
  • Title

    Non-contact investigation of metal-nanostructure conductivity

  • Author

    Fahsold, G. ; Kolb, T. ; Pucci, A.

  • Author_Institution
    Kirchhoff-Inst. fuer Phys., Heidelberg Univ., Germany
  • fYear
    2004
  • fDate
    27 Sept.-1 Oct. 2004
  • Firstpage
    803
  • Lastpage
    804
  • Abstract
    The dynamic conductivity of metal nanostructures is determined by material properties, the morphology in the volume of the nanostructure, its shape and its size, and by the structure and the chemical composition at the surfaces. IR-spectroscopic investigation of dynamic charge transport allows a distinction between such contributions. We performed in-situ IR spectroscopic measurements of metal ultrathin (<10 nm) films on non-metal substrates. Our thin-film model based calculations of IR spectra indicate depolarisation for inhomogeneous films, quantum confinement for homogeneous films, adsorbate induced charge carrier relaxation and charge transfer at thin film surfaces, and they provide a measure of the dc-conductivity of these nanosized metals in a non-contact fashion.
  • Keywords
    copper; electrical conductivity; electrical resistivity; infrared spectra; iron; metallic thin films; nanostructured materials; silver; size effect; surface composition; surface morphology; Ag; Cu; Fe; IR spectra; IR spectroscopic measurements; charge carrier relaxation; charge transfer; dc conductivity; depolarisation; dynamic charge transport; inhomogeneous films; material properties; metal nanostructure conductivity; metal ultrathin films; nanosized metals; nanostructure morphology; nonmetal substrates; quantum confinement; surface chemical composition; thin film surfaces; Chemicals; Conductivity; Infrared spectra; Material properties; Nanostructures; Performance evaluation; Shape; Spectroscopy; Surface morphology; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
  • Print_ISBN
    0-7803-8490-3
  • Type

    conf

  • DOI
    10.1109/ICIMW.2004.1422338
  • Filename
    1422338