Title :
Robust D-admissibility in generalized LMI regions for descriptor systems
Author :
Kuo, Chih-Hung ; Lee, Li
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
An LMI-based admissibility test for descriptor systems is investigated in this paper. Necessary and sufficient conditions for checking simultaneously the regularity, impulse immunity (or causal), and all finite eigenvalues locating in a prescribed generalized LMI region, denoted by P, are derived in both nonstrict and strict forms. Based on them, when norm-bounded uncertainty is considered, both nonstrict and strict sufficient conditions are obtained to guarantee robust D-admissibility of the entire family of uncertain systems.
Keywords :
eigenvalues and eigenfunctions; linear matrix inequalities; pole assignment; uncertain systems; admissibility test; descriptor systems; finite eigenvalues; generalized LMI regions; linear matrix inequalities; robust pole-clustering; uncertain systems; Eigenvalues and eigenfunctions; Mathematical model; Robust stability; Robustness; Sufficient conditions; System testing; Time domain analysis; Transient response; Uncertain systems; Uncertainty;
Conference_Titel :
Control Conference, 2004. 5th Asian
Conference_Location :
Melbourne, Victoria, Australia
Print_ISBN :
0-7803-8873-9
