DocumentCode
434144
Title
Methods for stability analysis and s-parameters measurements in SHF circuits
Author
Savelkaev, S.V. ; Plavsky, L.G. ; Petrov, V.P.
fYear
2004
fDate
21-24 Sept. 2004
Firstpage
230
Lastpage
230
Abstract
Methods for stability analysis and S-parameters measurements in SHF circuits are considered. The measurements are conducted in the mode of amplification and generation that are close to real operation conditions that ensures validity of S-parameters. The general structural principle of design of imitation digital analyzer for SHF circuits based on the above methods is proposed.
Keywords
Circuit analysis; Electrical resistance measurement; Fabrication; Protection; Resistance heating; Scattering parameters; Stability analysis; Textiles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location
Novosibirsk, Russia
Print_ISBN
0-7803-8476-8
Type
conf
Filename
1427293
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