Title :
Methods for stability analysis and s-parameters measurements in SHF circuits
Author :
Savelkaev, S.V. ; Plavsky, L.G. ; Petrov, V.P.
Abstract :
Methods for stability analysis and S-parameters measurements in SHF circuits are considered. The measurements are conducted in the mode of amplification and generation that are close to real operation conditions that ensures validity of S-parameters. The general structural principle of design of imitation digital analyzer for SHF circuits based on the above methods is proposed.
Keywords :
Circuit analysis; Electrical resistance measurement; Fabrication; Protection; Resistance heating; Scattering parameters; Stability analysis; Textiles;
Conference_Titel :
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
0-7803-8476-8
