DocumentCode :
434146
Title :
Measurement and identification of parameters of the microwave transistors in the mode of high signal.
Author :
Kudryavtsev, A.M. ; Malyshev, I.N. ; Nikulin, S.M. ; Prostakov, V.A.
fYear :
2004
fDate :
21-24 Sept. 2004
Firstpage :
230
Lastpage :
230
Abstract :
The solution for the correct reconstruction of S-parameters of SHF transistors in large signal mode using the results of measurements on strip lines having arbitrary wave resistance is proposed. The results of measurements of a transistor are obtained by simulation in program package Microwave Office.
Keywords :
Circuits; Electrical resistance measurement; Electromagnetic heating; Fabrication; Microwave measurements; Microwave transistors; Resistance heating; Scattering parameters; Signal processing; Stability analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
0-7803-8476-8
Type :
conf
Filename :
1427296
Link To Document :
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