DocumentCode :
434161
Title :
Role of reference specimens in the framework of metrological provision of electromagnetic properties of materials measurements at HF and SHF
Author :
Karikh, N.M. ; Matveychuk, V.F. ; Sibirtsev, S.N. ; Chernousova, N.N.
fYear :
2004
fDate :
21-24 Sept. 2004
Firstpage :
234
Lastpage :
234
Abstract :
Review in the area of design of means of measurements designed for reproduction, storing and transfer of dimension units for complex magnetic and dielectric permittivities in the radio and MW frequency ranges is presented.
Keywords :
Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Electrical resistance measurement; Electromagnetic measurements; Hafnium; Optical resonators; Permittivity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
0-7803-8476-8
Type :
conf
Filename :
1427315
Link To Document :
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