DocumentCode
434164
Title
Dielectric resonator method for measurement of parameters of laminated dielectrics at millimeter waves
Author
Egorov, V.N. ; Masalov, V.L.
fYear
2004
fDate
21-24 Sept. 2004
Firstpage
234
Lastpage
234
Abstract
The measurement method for permittivity, loss tangent and surface resistance of inner and outer side of metal layer of laminated dielectric substrates for millimeterwave devices is considered. The results of measurement of substrate dielectric parameters and surface resistance of free and dielectric covered copper foil at 36-45 GHz are presented.
Keywords
Copper; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Electrical resistance measurement; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location
Novosibirsk, Russia
Print_ISBN
0-7803-8476-8
Type
conf
Filename
1427318
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