Title :
Dielectric resonator method for measurement of parameters of laminated dielectrics at millimeter waves
Author :
Egorov, V.N. ; Masalov, V.L.
Abstract :
The measurement method for permittivity, loss tangent and surface resistance of inner and outer side of metal layer of laminated dielectric substrates for millimeterwave devices is considered. The results of measurement of substrate dielectric parameters and surface resistance of free and dielectric covered copper foil at 36-45 GHz are presented.
Keywords :
Copper; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Electrical resistance measurement; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Surface resistance;
Conference_Titel :
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
0-7803-8476-8
