Apparatus for measuring of dielectric structures with internal inhomogeneities

Apparatus for measuring of dielectric structures with internal inhomogeneities is based on combination of multifrequency measurements and transversal scanning. Longitudinal distance dependencies of reflectivity are obtained by synthesis from multifrequency data. The multifrequency measurements in range 38-52 GHz and synthesis are done in real-time using measuring modules of scalar reflectometer of series P2 (R2). Combination of data in longitudinal and transversal directions produces radio images of dielectric structures with embedded objects. Some results of testinga are presented.