Emission measurements of microcontrollers

Author

Steinecke, Thomas

Author_Institution

Infineon Technol. AG, Muenchen

Volume

1

fYear

2003

fDate

16-16 May 2003

Firstpage

98

Abstract

The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design steps. On the other hand, system designers are able to compare several competitive microcontrollers/ASICs with respect to their electromagnetic emission behaviour

Keywords

IEC standards; application specific integrated circuits; electromagnetic compatibility; integrated circuit testing; measurement standards; microcontrollers; ASIC manufacturers; EMC; IEC 61967; SAE; VDE; clocked semiconductor devices; electromagnetic emission characterization; international standard; microcontroller emission measurements; near field scan; semiconductor manufacturers; test standards; Application specific integrated circuits; Clocks; Electromagnetic devices; Electromagnetic measurements; IEC standards; Microcontrollers; Pulp manufacturing; Semiconductor device manufacture; Semiconductor device testing; Semiconductor devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on

Conference_Location

Istanbul

Print_ISBN

0-7803-7779-6

Type

conf

DOI

10.1109/ICSMC2.2003.1428203

Filename

1428203