Extraction of the internal impedance of VLSIs from the VLSI´s geometrical data

Author

Held, Joachim ; Girardeau, Ludovic

Author_Institution

Siemens AG

Volume

1

fYear

2003

fDate

16-16 May 2003

Firstpage

351

Abstract

In order to simulate the emission of PCBs (printed circuit boards) it is necessary to describe the RF-(radio-frequency)-sources very exactly in a wide frequency range. Due to internal switching of VLSIs a lot of RF-current-noise can be seen on their supply-pins. These currents I(f) are depending on the relationship between the impedance Z(f) of the supply-system of the VLSI and Z(f) into the supply-system of the PCB at the supply-pins of the VLSI. This paper describes an effective method to extract Z(f) from the VLSI´s geometrical data and compares it to measurement of Z(f)

Keywords

VLSI; electric impedance measurement; integrated circuit noise; printed circuits; radiofrequency interference; RF current noise; VLSI; geometrical data; impedance simulation; internal impedance; internal switching; printed circuit boards; radiofrequency sources; supply impedance; Bonding; CMOS technology; Capacitance; Circuit simulation; Data mining; Frequency measurement; Impedance measurement; Solid modeling; Variable structure systems; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on

Conference_Location

Istanbul

Print_ISBN

0-7803-7779-6

Type

conf

DOI

10.1109/ICSMC2.2003.1428263

Filename

1428263