Title :
Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials
Author :
Materassi, D. ; Basso, M. ; Genesio, R.
Author_Institution :
Dipt. di Sistemi e Informatica, Univ. di Firenze, Italy
Abstract :
The paper deals with harmonic balance analysis of tapping mode atomic force microscopes. The separation-amplitude curve is analytically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.
Keywords :
atomic force microscopy; harmonic analysis; micropositioning; nonlinear control systems; atomic force microscopes; common tip-sample interaction potentials; frequency analysis; harmonic balance analysis; nonlinear known phenomena; repulsive-attractive interaction potentials; separation-amplitude curve; tapping mode; Atomic force microscopy; Biological system modeling; Biomedical optical imaging; Frequency; Harmonic analysis; Image resolution; Instruments; Nanobioscience; Nanoscale devices; Surface topography;
Conference_Titel :
Decision and Control, 2004. CDC. 43rd IEEE Conference on
Print_ISBN :
0-7803-8682-5
DOI :
10.1109/CDC.2004.1428934
