Title :
Influence of operation- and program-states on the breakdown effects of electronics by impact of EMP and UWB
Author :
Camp, Michael ; Garbe, Heyno
Keywords :
Bandwidth; Circuit testing; EMP radiation effects; Electric breakdown; Electromagnetic measurements; Electromagnetic transients; Electromagnetic waveguides; Magnetic field measurement; Pulse measurements; Shift registers;
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7779-6
DOI :
10.1109/ICSMC2.2003.1429090
