DocumentCode :
434833
Title :
A genetic algorithm based interconnect discontinuity model for multi-Gb/s circuits
Author :
Erdin, Ihsan
Author_Institution :
Nortel Networks, Ottawa, Ont., Canada
Volume :
2
fYear :
2003
fDate :
11-16 May 2003
Firstpage :
1129
Abstract :
A genetic algorithm-based method is presented to model the interconnect discontinuities in multi-Gb/s systems. In the proposed algorithm, only the s11-parameter of a discontinuity is needed. The data can be obtained either from measurements or 3D-electromagnetic simulations. The measurement/simulation results are processed with genetic algorithm optimization technique (GAOT) to compute the values of lumped circuit components that model the discontinuity. Eliminating the need for measurement/simulation and post-processing for all entries of the S-parameter matrix as well as de-embedding, the proposed algorithm improves the computational cost while preserving the accuracy of the model. The results of the algorithm show good agreement to measurements.
Keywords :
S-matrix theory; S-parameters; SPICE; circuit optimisation; genetic algorithms; integrated circuit interconnections; lumped parameter networks; strip line discontinuities; 3D-electromagnetic simulations; S-parameter matrix; SPICE; computational cost; de-embedding; genetic algorithm optimization technique; interconnect discontinuity model; lumped circuit components; multiGb/s circuits; Circuit simulation; Electromagnetic measurements; Genetic algorithms; Impedance; Integrated circuit interconnections; Pollution measurement; Propagation constant; Scattering parameters; Transmission line discontinuities; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7779-6
Type :
conf
DOI :
10.1109/ICSMC2.2003.1429115
Filename :
1429115
Link To Document :
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