Title :
Transient ultra wide band measurement applications: radar cross section, synthetic aperture radar, electromagnetic compatibility
Author :
Andrieu, J. ; Dubois, C. ; Lalande, M. ; Bertrand, V. ; Delmote, P. ; Beillard, B. ; Martinod, E. ; Jecko, B. ; Guilleret, R. ; Monnier, F. ; Legoff, M.
Author_Institution :
IRCOM, Limoges Univ., France
Abstract :
The Electronic Armament Centre (CELAR: Centre d´Electronique de L´Armement) and the Research Institute of Microwave and Optical Communications (IRCOM: Institut de Recherches en Communications Optiques et Micro-ondes) has evaluated the use of ultra-wide-band (UWB) short pulse measurement facilities to characterize target electromagnetic signatures. A first device is capable of determining the radar cross section (RCS) within a 200 MHz to 1.2 GHz frequency band. A second device, an UWB synthetic aperture radar (SAR), is dedicated to pulse measurements on outdoor targets (buried mines) and low frequency clutter. These transient techniques are soon used for EM coupling applications on various systems.
Keywords :
electromagnetic compatibility; electromagnetic coupling; landmine detection; pulse measurement; radar clutter; radar cross-sections; radar detection; synthetic aperture radar; ultra wideband radar; 200 MHz to 1.2 GHz; CELAR; Centre d´Electronique de L´Armement; EM coupling applications; Electronic Armament Centre; IRCOM; Institut de Recherches en Communications Optiques et Micro-ondes; RCS; Research Institute of Microwave and Optical Communications; SAR; UWB synthetic aperture radar; buried mines; electromagnetic compatibility; low frequency clutter; radar cross section; target electromagnetic signatures; transient ultra wideband short pulse measurement; ultra wideband synthetic aperture radar; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic transients; Frequency; Microwave communication; Microwave devices; Optical fiber communication; Pulse measurements; Radar cross section; Ultra wideband radar;
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7779-6
DOI :
10.1109/ICSMC2.2003.1429161