Title : 
Constitutive modeling of lead-free solders
         
        
            Author : 
Pei, M. ; Qu, J.
         
        
            Author_Institution : 
Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
         
        
        
        
        
        
            Abstract : 
Solders are used extensively as electrical interconnects in microelectronics packaging. Because of environmental concerns, lead-based solders are being replaced by Sn/Ag and Sn/Ag/Cu based solder materials. Since the thermomechanical reliability of modern electronic devices depends on, to a large extent, the fatigue and creep behavior of the solder joints, it is imperative to understand the deformation behavior of these new lead-free solders. This study conducted extensive thermomechanical testing on several commercial lead-free solder alloys. Anand viscoplastic model was used to describe the behavior of these materials with new curve fitting techniques. A modified Anand models was proposed that can yield a more accurate description of lead-free solders.
         
        
            Keywords : 
copper alloys; creep; curve fitting; fatigue; mechanical testing; reliability; silver alloys; solders; tin alloys; viscoplasticity; Anand viscoplastic model; SnAgCu; constitutive modeling; creep behavior; curve fitting; deformation behavior; electrical interconnects; electronic devices; fatigue behavior; lead-free solder alloys; microelectronics packaging; solder joint; solder material; thermomechanical reliability; thermomechanical testing; Conducting materials; Creep; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Fatigue; Lead; Microelectronics; Soldering; Thermomechanical processes; Tin;
         
        
        
        
            Conference_Titel : 
Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
         
        
        
            Print_ISBN : 
0-7803-9085-7
         
        
            Electronic_ISBN : 
1550-5723
         
        
        
            DOI : 
10.1109/ISAPM.2005.1432043