Title :
Digital and analog system testing: fundamentals and new challenges
Author_Institution :
Lab. d´´ Informatique, Robotique et Micro-Electron. de Montpellier, France
Abstract :
This paper first introduces the fundamentals of digital testing with a special emphasis on the quality-cost tradeoff which guarantees the viability of the process. Different test solutions are then presented with the corresponding advantages and drawbacks. It is demonstrated that the structural test approach is the most viable solution. Finally, the challenges of system-on-chip testing are specifically analyzed highlighting the key parameters.
Keywords :
analogue integrated circuits; digital integrated circuits; integrated circuit testing; system-on-chip; analog system testing; digital system testing; quality costing; system-on-chip testing; Circuit faults; Circuit testing; Costs; Equations; Information processing; Manufacturing processes; Microprocessors; Robots; System testing; System-on-a-chip;
Conference_Titel :
Microelectronics, 2004. ICM 2004 Proceedings. The 16th International Conference on
Print_ISBN :
0-7803-8656-6
DOI :
10.1109/ICM.2004.1434191