• DocumentCode
    435702
  • Title

    Multi-gate CMOS with fin-channel structures beyond planar CMOS scaling limits

  • Author

    Hisamoto, Digh

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    1
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    96
  • Abstract
    A great deal of attention has been paid to FD-SOI and multi-gate devices because they show promise in overcoming device scaling limits. Here, many reported types of fin-channel devices are reviewed regarding their potential as technology boosters for post-CMOS scaling. This paper demonstrates that double-, triple-, and quadruple-gates have different advantages. Therefore, the device structure should be individually designed accordingly for specific applications.
  • Keywords
    CMOS integrated circuits; integrated circuit design; silicon-on-insulator; FD-SOI; device scaling; device structure; fin-channel structures; multi-gate CMOS; planar CMOS scaling; CMOS technology; Capacitance; Degradation; Etching; Face recognition; FinFETs; Laboratories; MOSFETs; Oxidation; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1434962
  • Filename
    1434962