Title :
Multi-gate CMOS with fin-channel structures beyond planar CMOS scaling limits
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
A great deal of attention has been paid to FD-SOI and multi-gate devices because they show promise in overcoming device scaling limits. Here, many reported types of fin-channel devices are reviewed regarding their potential as technology boosters for post-CMOS scaling. This paper demonstrates that double-, triple-, and quadruple-gates have different advantages. Therefore, the device structure should be individually designed accordingly for specific applications.
Keywords :
CMOS integrated circuits; integrated circuit design; silicon-on-insulator; FD-SOI; device scaling; device structure; fin-channel structures; multi-gate CMOS; planar CMOS scaling; CMOS technology; Capacitance; Degradation; Etching; Face recognition; FinFETs; Laboratories; MOSFETs; Oxidation; Semiconductor materials;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1434962