DocumentCode :
43586
Title :
RESURF p-n Diode With a Buried Layer, a Comprehensive Study
Author :
Fu-Jen Yang ; Jeng Gong ; Ru-Yi Su ; Chun-Lin Tsai ; Hsiao-Chin Tuan ; Chih-Fang Huang
Author_Institution :
Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
60
Issue :
11
fYear :
2013
fDate :
Nov. 2013
Firstpage :
3835
Lastpage :
3841
Abstract :
In this paper, important parameters of the p-buried layer of a high-voltage reduced surface field p-n diode are analyzed and discussed in terms of effects on device performance, including breakdown voltage and specific turn-on resistance, Ron,sp. Guidelines for optimizing the vertical position, lateral location, and doping concentration of the p-buried layer are suggested. The experimental results demonstrate that the p-n diode with the proposed p-buried layer optimization design can improve breakdown voltage by 30.7% but only increases 2.7% in specific on-resistance Ron,sp.
Keywords :
buried layers; semiconductor diodes; RESURF p-n diode; breakdown voltage; doping concentration; high-voltage reduced surface field p-n diode; lateral location; p-buried layer optimization design; specific turn-on resistance; vertical position; Avalanche breakdown; Electric potential; High-voltage techniques; Semiconductor diodes; Voltage control; Breakdown voltage; buried layer; p-n diode and reduced surface field (RESURF); power device;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2283582
Filename :
6624119
Link To Document :
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