DocumentCode :
435935
Title :
An overview of device modeling in bridging manufacturing and design for RF applications
Author :
Cheng, Yuhua
Author_Institution :
Sky works Solutions Inc., Irvine, CA, USA
Volume :
2
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
1123
Abstract :
CMOS has become a viable option for RF applications and system-on-chip. This paper reviews device modeling in predicting device behavior for RF IC applications. CMOS downsealing is discussed to examine the trend of device scaling and its impact to high frequency performance of devices. Some device behavior in advanced technology nodes is analyzed to be included in advanced device models. RF models to predict DC, AC noise and distortion behavior are desired while additional modeling efforts are required for parasitics such as interconnect and substrate.
Keywords :
CMOS integrated circuits; radiofrequency integrated circuits; semiconductor device models; CMOS downsealing; RF applications; device behavior prediction; device modeling; device scaling; system-on-chip; Application specific integrated circuits; CMOS technology; Integrated circuit modeling; Integrated circuit noise; Predictive models; Radio frequency; Radiofrequency integrated circuits; Semiconductor device modeling; System-on-a-chip; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
Type :
conf
DOI :
10.1109/ICSICT.2004.1436712
Filename :
1436712
Link To Document :
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