Title :
Meeting the design challenges in modern RFCMOS technology
Author :
Wang, Xudong ; Pekarik, John ; Yuan, Xiaojuen ; Anna, Raghunadha ; Parker, Scott
Author_Institution :
Semicond. R&D Center, IBM Microelectron., Essex Junction, VT, USA
Abstract :
This paper describes the challenges of designing RF integrated circuits using the advanced RFCMOS technology. Following an overview of the RFCMOS process, design challenges for low cost, high performance RFICs and their integration issues are discussed. Discussions show that these challenges can be addressed through innovative circuit and system design, technology enhancement, accurate model support and close collaboration among designers and technology providers.
Keywords :
CMOS integrated circuits; integrated circuit design; radiofrequency integrated circuits; RFCMOS technology; radiofrequency integrated circuits; BiCMOS integrated circuits; CMOS technology; Capacitance; Conductivity; Costs; Integrated circuit technology; MOSFETs; Radio frequency; Radiofrequency integrated circuits; Scalability;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1436776
