DocumentCode :
436448
Title :
Diagnosis of a manufacturing cell
Author :
Olmos, J. ; Cardenas, Carlos ; Garcia, D. ; Baeyens, E. ; de Miguel, L.J.
Author_Institution :
CARTIF, Spain
Volume :
18
fYear :
2004
fDate :
June 28 2004-July 1 2004
Firstpage :
455
Lastpage :
460
Abstract :
Diagnostic of systems are having more importance in the manufacturing process. There exist several frameworks for synthesis of supervisors and diagnosers for Discrete Event System (DES). We propose a benchmark manufacturing cell and Some experiences of designing diagnosers we carried out using the Ramage and Wonham framework for decentralized discrete event 5ystems. In this paper, we work with common problem in highly automated systems; to locate quickly in correct state (quick localization of cycle).
Keywords :
Delay; Discrete event systems; Event detection; Production systems; Robots; Sampling methods; Sensor systems; Virtual manufacturing; DES; Diagnoser; discrete event systems; event control; manufacturing cell; modeling; supervision;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Congress, 2004. Proceedings. World
Conference_Location :
Seville
Print_ISBN :
1-889335-21-5
Type :
conf
Filename :
1441083
Link To Document :
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