Title :
Displacement damage characterization of laser diodes
Author :
Johnston, A.H. ; Miyahira, T.F.
Keywords :
Annealing; Current density; Degradation; Diode lasers; Laboratories; Power lasers; Protons; Radiative recombination; Testing; Threshold current;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
