DocumentCode

436693

Title

Displacement damage characterization of laser diodes

Author

Johnston, A.H. ; Miyahira, T.F.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

3

Lastpage

9

Keywords

Annealing; Current density; Degradation; Diode lasers; Laboratories; Power lasers; Protons; Radiative recombination; Testing; Threshold current;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

conf

Filename

1442363