Title :
Radiation effects on a radiation tolerant CMOS active pixel sensor
Author :
Hopkinson, G.R. ; Mohammadzadeh, A. ; Harboe-Sorensen, R.
Keywords :
CMOS image sensors; CMOS technology; Charge coupled devices; Clocks; Latches; Protons; Radiation effects; Telephony; Testing; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8