436706

Development of monte carlo modeling for proton induced charge in si pin photodiode

Onoda, S. ; Hirao, T. ; Laird, J.S. ; Wakasa, T. ; Yamakawa, T. ; Okamoto, T. ; Koizumi, Y. ; Kamiya, T.

2003

15-19 Sept. 2003

89

93

Bit error rate; Current measurement; Databases; Degradation; Monte Carlo methods; Nuclear power generation; Optical receivers; PIN photodiodes; Protons; Single event upset;

English

ieee

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Noordwijk, The Netherlands

0379-6566

92-9092-846-8

conf

1442403