DocumentCode :
436711
Title :
TID and SEE performance of a commercial 0.13 /spl mu/m CMOS technology
Author :
Hänsler, Kurt ; Anelli, Giovanni ; Baldi, Silvia ; Faccio, Federico ; Hajdas, Wojtek ; Marchioro, Alessandro
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
119
Lastpage :
125
Keywords :
Application specific integrated circuits; CMOS technology; Copper; Integrated circuit technology; MOS devices; Metal-insulator structures; Nuclear power generation; Random access memory; Testing; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442412
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436711
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