DocumentCode
436722
Title
Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems
Author
Miller, F. ; Germain, A. ; Board, Nesma ; Gaillard, R. ; Poirot, P. ; Chatry, C. ; Carrière, T. ; Dufayel, R.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
199
Lastpage
209
Keywords
Absorption; Aerospace electronics; Aerospace industry; Circuit testing; Integrated circuit testing; Ionization; Optical pulses; Photonic band gap; Silicon; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442435
Link To Document