DocumentCode :
436725
Title :
Comparative simulations of single event upsets induced by protons and neutrons in commercial srams
Author :
Dyer, Clive ; Clucas, Simon ; Lei, Fan ; Truscott, Peter ; Nartello, Ramon ; Comber, Clive
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
225
Lastpage :
229
Keywords :
Circuit simulation; Discrete event simulation; Neutrons; Predictive models; Protons; Random access memory; Single event transient; Single event upset; Space technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442440
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436725
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