DocumentCode
436725
Title
Comparative simulations of single event upsets induced by protons and neutrons in commercial srams
Author
Dyer, Clive ; Clucas, Simon ; Lei, Fan ; Truscott, Peter ; Nartello, Ramon ; Comber, Clive
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
225
Lastpage
229
Keywords
Circuit simulation; Discrete event simulation; Neutrons; Predictive models; Protons; Random access memory; Single event transient; Single event upset; Space technology; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442440
Link To Document