• DocumentCode
    436726
  • Title

    SOI: is it the solution to commercial product SEU sensitivity?

  • Author

    Haddad, Nadim ; Brown, Ron ; Ferguson, Richard ; Hatfield, Craig ; Rea, David

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    231
  • Lastpage
    234
  • Keywords
    CMOS technology; Circuit testing; Materials testing; Medical tests; Microprocessors; Performance evaluation; Protons; Silicon on insulator technology; Single event upset; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442442
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436726