DocumentCode

436729

Title

Physical model of single heavy ION induced hard errors

Author

Useinov, R.G. ; Zebre, G.I. ; Emelianov, V.V. ; Persbenkov, V.S. ; Ulimov, V.N.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

249

Lastpage

252

Keywords

Circuits; Error correction; Fluctuations; Instruments; Leakage current; MOSFETs; Microelectronics; Random access memory; Statistics; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

conf

Filename

1442447