Title : 
Comparison of xilinx virtex-II FPGA SEE sensitivities to protons and heavy ions
         
        
            Author : 
Koga, R. ; George, J. ; Swift, G. ; Yui, C. ; Edmonds, L. ; Cannichael, C. ; Langley, T. ; Murray, P. ; Lanes, K. ; Napier, M.
         
        
        
        
        
        
            Abstract : 
A comparison of heavy-ion and proton-induced single event effect sensitivities has been made using the Xilinx Virtex-11 field programmable gate array (FPGA). Recently fabricated test samples are selected for observations of single event upset and single event functional interrupt. A complex relationship appears to exist between the heavy ion and proton sensitivities due to effects such as multiplrbit upsets and elastic nuclear scattering.
         
        
            Keywords : 
Atomic layer deposition; Equations; Field programmable gate arrays; Ionization; Protons; SRAM chips; Scattering; Silicon; Single event upset; Testing;
         
        
        
        
            Conference_Titel : 
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
         
        
            Conference_Location : 
Noordwijk, The Netherlands
         
        
        
            Print_ISBN : 
92-9092-846-8