• DocumentCode
    436735
  • Title

    Single event upsets on a read only memory based complex programmable logic device

  • Author

    Faure, F. ; Velazco, R.

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    279
  • Lastpage
    282
  • Keywords
    Clocks; Flip-flops; Programmable logic devices; Pulse inverters; Random access memory; Read only memory; Single event transient; Single event upset; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442454
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436735