DocumentCode :
436743
Title :
System-level design hardening based on worst-case ASET simulations
Author :
Boulghassou, Y. ; Adell, Philippe C. ; Rowe, Jason D. ; Massengill, Lloyd W. ; Schrimpf, Ron D. ; Sternberg, Andrew L.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
327
Lastpage :
333
Keywords :
Batteries; Circuit simulation; Circuit testing; Consumer electronics; Electronic equipment testing; Operational amplifiers; Pulse amplifiers; Satellites; System testing; System-level design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442469
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436743
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