436749

Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 /spl mu/m CMOS devices and read-out circuits

Simoen, E. ; Mercha, A. ; Creten, Y. ; Merken, P. ; Putzeys, J. ; De Moor, P. ; Claeys, C. ; Van Hoof, C. ; Mohammadzadeh, A. ; Nickson, R.

2003

15-19 Sept. 2003

369

375

CMOS technology; Circuit testing; Cryogenic electronics; Degradation; Electronic equipment testing; Helium; MOSFETs; Protons; Prototypes; Temperature dependence;

English

ieee

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Noordwijk, The Netherlands

0379-6566

92-9092-846-8

conf

1442483