DocumentCode
436749
Title
Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 /spl mu/m CMOS devices and read-out circuits
Author
Simoen, E. ; Mercha, A. ; Creten, Y. ; Merken, P. ; Putzeys, J. ; De Moor, P. ; Claeys, C. ; Van Hoof, C. ; Mohammadzadeh, A. ; Nickson, R.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
369
Lastpage
375
Keywords
CMOS technology; Circuit testing; Cryogenic electronics; Degradation; Electronic equipment testing; Helium; MOSFETs; Protons; Prototypes; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442483
Link To Document