Title :
40 simplified one parameter proton-induced SEU cross section dependence
Keywords :
Artificial intelligence; CMOS integrated circuits; Computer simulation; Energy exchange; Ion accelerators; Ion beams; Particle scattering; Protons; Single event upset; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
