DocumentCode :
436755
Title :
Proton induced damage in JFET transistors and charge preamplifiers on high-resistivity silicon
Author :
Betta, Gian Franco Dalla ; Manghisoni, Massimo ; Ratti, Lodovico ; Re, Valerio ; Speziali, Valeria ; Traversi, Gianluca ; Candelori, Andrea
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
419
Lastpage :
424
Keywords :
Circuits; Detectors; Fabrication; MOSFETs; Preamplifiers; Protons; Sensor phenomena and characterization; Signal processing; Silicon; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442496
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436755
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