Title :
Radiation-induced back channel leakage in 60 MeV-proton-irradiated 0.10 /spl mu/m-CMOS partially depleted SOI MOSFETs
Author :
Rafi, J.M. ; Mercha, A. ; Simoen, E. ; Claeys, C. ; Mohammadzadeh, Ali
Keywords :
Degradation; Geometry; Leakage current; MOSFETs; Protons; Semiconductor films; Silicon on insulator technology; Space technology; Switches; Transconductance;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
