Title :
Buildup and annealing of interface traps under the influence of low-dose rate space irradiation taking into account high-frequency gate bias switches
Author :
Zebrev, G.I. ; Pershenkov, V.S. ; Shvetzov-Shilovsky, I.N. ; Morozov, I.S. ; Ulimov, V.N. ; Emeliano, A.V.
Keywords :
Annealing; Delay; Equations; Frequency; Instruments; MOSFET circuits; Physics; Space missions; Switches; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
