Title : 
The SIRAD irradiation facility for bulk damage and single event effect studies
         
        
            Author : 
Bisello, D. ; Candelori, A. ; Giubilato, P. ; Kaminski, A. ; Pantano, D. ; Rando, R. ; Tessaro, M. ; Wyss, J.
         
        
        
        
        
        
            Keywords : 
Aerospace electronics; Atomic layer deposition; Electrons; Ionization; Laboratories; Particle measurements; Semiconductor devices; Solar power generation; Space technology; System testing;
         
        
        
        
            Conference_Titel : 
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
         
        
            Conference_Location : 
Noordwijk, The Netherlands
         
        
        
            Print_ISBN : 
92-9092-846-8