DocumentCode
436765
Title
The effect of different biasing configurations on radfet response measured by automated read-out system
Author
Jaksic, A. ; Kimoto, Y. ; Ogourtsov, V. ; Polischuk, V. ; Mohammadzadeh, A. ; Mathewson, A.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
489
Lastpage
492
Keywords
Aerospace industry; Circuits; Current measurement; Energy consumption; Fading; MOSFETs; Real time systems; Research and development; Space charge; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442516
Link To Document