DocumentCode :
436775
Title :
Compendia of TID and see test results of space qualified integrated circuits
Author :
Lavton, P. ; Williamson, G. ; Patnaude, E. ; Longden, L. ; Thibodeau, C. ; Kazak, B. ; Sloan, C.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
547
Lastpage :
552
Keywords :
Circuit testing; Cyclotrons; Integrated circuit technology; Integrated circuit testing; Ion accelerators; Performance evaluation; Production; Radiation effects; Space technology; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442535
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436775
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